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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 28 — Oct. 1, 2005
  • pp: 5847–5854

Phase-space formulation for phase-contrast x-ray imaging

Xizeng Wu and Hong Liu  »View Author Affiliations


Applied Optics, Vol. 44, Issue 28, pp. 5847-5854 (2005)
http://dx.doi.org/10.1364/AO.44.005847


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Abstract

Phase-space formulation based on the Wigner distribution has been presented for analyzing phase-contrast image formation. Based on the statistical nature and affine canonical covariance of Wigner distributions in the phase space, we show that the partial coherence effects of incident x-ray wave field on image intensity are simply accounted for by a multiplication factor, which is the reduced complex degree of coherence of the incident x-ray wave field. We show especially that with the undulator sources one cannot obtain the phase-contrast intensity by summing over the contributions from all electron positions, since the van Cittert–Zernike theorem fails in general for undulators. We derive a comprehensive formula that quantifies the effects of partial spatial coherence, polychromatic spectrum, body attenuation, imaging-detector resolution, and radiation dose on phase-contrast visibility in clinical imaging. The results of our computer modeling and simulations show how the formula can provide design guidelines and optimal parameters for clinical x-ray phase-contrast imaging systems.

© 2005 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(030.1640) Coherence and statistical optics : Coherence
(030.1670) Coherence and statistical optics : Coherent optical effects
(340.7440) X-ray optics : X-ray imaging

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: January 21, 2005
Revised Manuscript: May 6, 2005
Manuscript Accepted: May 7, 2005
Published: October 1, 2005

Citation
Xizeng Wu and Hong Liu, "Phase-space formulation for phase-contrast x-ray imaging," Appl. Opt. 44, 5847-5854 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-28-5847

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