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Applied Optics

Applied Optics


  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 29 — Oct. 10, 2005
  • pp: 6228–6234

Phase retrieval from diffraction intensities by use of a scanning slit aperture

Nobuharu Nakajima  »View Author Affiliations

Applied Optics, Vol. 44, Issue 29, pp. 6228-6234 (2005)

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A noniterative method of retrieving the phase of a wave field from intensities measured during scanning of a slit aperture is proposed. In the measurements, one records the diffraction intensities of wave fields transmitted through a slit that is scanned along two directions in the Fresnel-zone plane of an object’s field. From these intensities, the phase in the Fresnel-zone plane can be retrieved by a method in which a novel phase calculation technique that uses Fourier transforms is included. Because the method does not require lens systems, it provides a potentially useful means for coherent imaging by use of x rays, electrons, or nuclear particles.

© 2005 Optical Society of America

OCIS Codes
(100.3190) Image processing : Inverse problems
(100.5070) Image processing : Phase retrieval

ToC Category:
Image Processing

Original Manuscript: March 17, 2005
Revised Manuscript: May 17, 2005
Manuscript Accepted: May 18, 2005
Published: October 10, 2005

Nobuharu Nakajima, "Phase retrieval from diffraction intensities by use of a scanning slit aperture," Appl. Opt. 44, 6228-6234 (2005)

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