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Applied Optics

Applied Optics


  • Vol. 44, Iss. 3 — Jan. 20, 2005
  • pp: 384–390

Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm

Julien Gautier, Franck Delmotte, Marc Roulliay, Françoise Bridou, Marie-Françoise Ravet, and Arnaud Jérome  »View Author Affiliations

Applied Optics, Vol. 44, Issue 3, pp. 384-390 (2005)

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We study theoretically and experimentally the increase of normal incidence reflectivity generated by addition of a third material in the period of a standard periodic multilayer, for wavelengths in the range 20 to 40 nm. The nature and thickness of the three materials has been optimized to provide the best enhancement of reflectivity. Theoretical reflectivity of an optimized B4C/Mo/Si multilayer reaches 42% at 32 nm. B4C/Mo/Si multilayers have been deposited with a magnetron sputtering system and a reflectivity of 34% at 32 nm has been measured on a synchrotron radiation source.

© 2005 Optical Society of America

OCIS Codes
(310.1860) Thin films : Deposition and fabrication
(340.7470) X-ray optics : X-ray mirrors

Original Manuscript: December 22, 2003
Revised Manuscript: July 7, 2004
Manuscript Accepted: October 12, 2004
Published: January 20, 2005

Julien Gautier, Franck Delmotte, Marc Roulliay, Françoise Bridou, Marie-Françoise Ravet, and Arnaud Jérome, "Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm," Appl. Opt. 44, 384-390 (2005)

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