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Applied Optics

Applied Optics


  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 32 — Nov. 10, 2005
  • pp: 6849–6856

Terahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film

Takeshi Yasui, Takashi Yasuda, Ken-ichi Sawanaka, and Tsutomu Araki  »View Author Affiliations

Applied Optics, Vol. 44, Issue 32, pp. 6849-6856 (2005)

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We propose a paintmeter for noncontact and remote monitoring of the thickness and drying progress of a paint film based on the time-of-flight measurement of the echo signal of a terahertz (THz) electromagnetic pulse. The proposed method is effectively applied to two-dimensional mapping of the painting thickness distribution for single-layer and multilayer paint films. Furthermore, adequate parameters for the drying progress are extracted from the THz pulse-echo signal and effectively applied to monitor the wet-to-dry transformation. The THz paintmeter can be a powerful tool for quality control of the paint film on the in-process monitoring of car body painting.

© 2005 Optical Society of America

OCIS Codes
(110.6960) Imaging systems : Tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(300.6270) Spectroscopy : Spectroscopy, far infrared
(310.1620) Thin films : Interference coatings

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 22, 2005
Revised Manuscript: July 21, 2005
Manuscript Accepted: July 25, 2005
Published: November 10, 2005

Takeshi Yasui, Takashi Yasuda, Ken-ichi Sawanaka, and Tsutomu Araki, "Terahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film," Appl. Opt. 44, 6849-6856 (2005)

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