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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 33 — Nov. 20, 2005
  • pp: 7098–7105

Fundamental spatial resolution of an x-ray pore optic

Arjan L. Mieremet and Marco W. Beijersbergen  »View Author Affiliations


Applied Optics, Vol. 44, Issue 33, pp. 7098-7105 (2005)
http://dx.doi.org/10.1364/AO.44.007098


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Abstract

We investigate the fundamental spatial resolution of an x-ray pore optic as a function of the pore dimensions, the photon energy, and the focal length. We achieve this by calculating the shape of the focal spot, using diffraction integrals such that the half-energy width is determined. Quantitative results are presented for the X-Ray Evolving Universe Spectroscopy (XEUS) telescope, showing that a resolution of better than 2 arc sec half-energy width is possible by use of an optic with pore sizes of approximately 0.5 mm.

© 2005 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(110.7440) Imaging systems : X-ray imaging
(340.7470) X-ray optics : X-ray mirrors
(350.1260) Other areas of optics : Astronomical optics

ToC Category:
X-ray Optics

History
Original Manuscript: May 3, 2005
Revised Manuscript: July 11, 2005
Manuscript Accepted: July 13, 2005
Published: November 20, 2005

Citation
Arjan L. Mieremet and Marco W. Beijersbergen, "Fundamental spatial resolution of an x-ray pore optic," Appl. Opt. 44, 7098-7105 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-33-7098

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