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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 33 — Nov. 20, 2005
  • pp: 7098–7105

Fundamental spatial resolution of an x-ray pore optic

Arjan L. Mieremet and Marco W. Beijersbergen  »View Author Affiliations


Applied Optics, Vol. 44, Issue 33, pp. 7098-7105 (2005)
http://dx.doi.org/10.1364/AO.44.007098


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Abstract

We investigate the fundamental spatial resolution of an x-ray pore optic as a function of the pore dimensions, the photon energy, and the focal length. We achieve this by calculating the shape of the focal spot, using diffraction integrals such that the half-energy width is determined. Quantitative results are presented for the X-Ray Evolving Universe Spectroscopy (XEUS) telescope, showing that a resolution of better than 2 arc sec half-energy width is possible by use of an optic with pore sizes of approximately 0.5 mm.

© 2005 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(110.7440) Imaging systems : X-ray imaging
(340.7470) X-ray optics : X-ray mirrors
(350.1260) Other areas of optics : Astronomical optics

ToC Category:
X-ray Optics

Citation
Arjan L. Mieremet and Marco W. Beijersbergen, "Fundamental spatial resolution of an x-ray pore optic," Appl. Opt. 44, 7098-7105 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-33-7098


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References

  1. A. N. Parmar, M. Arnaud, X. Barcons, J. Bleeker, G. Hasinger, H. Inoue, G. Palumbo, and M. Turner, "Science with XEUS: the X-ray Evolving Universe Spectroscopy Mission," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 388-393 (2004). [CrossRef]
  2. M. Bavdaz, D. Lumb, and A. Peacock, "XEUS mission reference design," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 829-836 (2004). [CrossRef]
  3. M. Beijersbergen, M. Bavdaz, A. Peacock, E. Tomaselli, R. Fairbend, J.-P. Boutot, S. Flyckt, A. Brunton, G. Price, G. Fraser, C. Herrmann, M. Krumrey, E. Ziegler, and A. Freund, "High-resolution micropore x-ray optics produced with microchannel plate technology," in Advances in X-Ray Optics, A. Freund, T. Ishikawa, A. Khounsary, D. Mancini, A. Michette, and S. Oestreich, eds., Proc. SPIE 4145, 188-192 (2001). [CrossRef]
  4. M. Beijersbergen, S. Kraft, R. Guenther, A. Mieremet, M. Collon, M. Bavdaz, D. Lumb, and A. Peacock, "Silicon pore optics: novel lightweight high-resolution X-ray optics developed for XEUS," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 868-874 (2004). [CrossRef]
  5. H. Wolter, "Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen," Ann. Phys. 10, 94-114 (1952).
  6. M. Born and E. Wolf, Principles of Optics (Cambridge U. Press, 1999), pp. 412-516.
  7. F. Pedrotti and L. Pedrotti, Introduction to Optics (Prentice-Hall, 1987), pp. 323-348.
  8. The exact solution for the prefactor z can be found by solution of the equation Int02(sin x/x)2 dx=½ Int0∞(sin x/x)2 dx. This equation can be rewritten into [cos(2z)-1]/(2z)+Si(2z)=pi/4, where Si is the sine-integral function, giving z=0.850. This solution has to be divided by pi to yield the relative position of the HEW with respect to the first zero points of the central peak of the diffraction pattern.
  9. I. S. Gradsteyn and I. M. Ryzhik, Table of Integrals, Series and Products, 6th ed. (Academic, 2000).

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