Optical vector network analyzer for single-scan measurements of loss, group delay, and polarization mode dispersion
Applied Optics, Vol. 44, Issue 34, pp. 7282-7286 (2005)
http://dx.doi.org/10.1364/AO.44.007282
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Abstract
We present a method for measuring the complete linear response, including amplitude, phase, and polarization, of a fiber-optic component or assembly that requires only a single scan of a tunable laser source. The method employs polarization-diverse swept-wavelength interferometry to measure the matrix transfer function of a device under test. We outline the theory of operation to establish how the transfer function is obtained. We demonstrate the enhanced accuracy, precision, and dynamic range of the technique through measurements of several components.
© 2005 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
ToC Category:
Instrumentation, Measurement, and Metrology
Citation
Dawn K. Gifford, Brian J. Soller, Matthew S. Wolfe, and Mark E. Froggatt, "Optical vector network analyzer for single-scan measurements of loss, group delay, and polarization mode dispersion," Appl. Opt. 44, 7282-7286 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-34-7282
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