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Applied Optics

Applied Optics


  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 35 — Dec. 10, 2005
  • pp: 7509–7514

Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry

Chien-Chung Tsai, Chien Chou, Chien-Yuan Han, Cheng-Hung Hsieh, Kuo-Yu Liao, and Yu-Faye Chao  »View Author Affiliations

Applied Optics, Vol. 44, Issue 35, pp. 7509-7514 (2005)

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What is believed to be a novel phase-sensitive optical heterodyne interferometric ellipsometer is set up to characterize a twisted-nematic liquid crystal (TN-LC) by the elliptical parameters of the output polarization state. This ellipsometer presents the advantages of both polarized optical heterodyne interferometry and optical photometry, which introduce a polarization modulation that is capable of performing with high-sensitivity on phase detection in real time. The twist angle Φ and the untwisted phase retardation Γ of TN-LC are measured precisely. The experimental results verify that a TN-LC can be treated as identical to an elliptical retarder.

© 2005 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5240) Instrumentation, measurement, and metrology : Photometry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.3710) Materials : Liquid crystals

ToC Category:
Ellipsometry and Polarimetry

Original Manuscript: May 9, 2005
Manuscript Accepted: June 23, 2005
Published: December 10, 2005

Chien-Chung Tsai, Chien Chou, Chien-Yuan Han, Cheng-Hung Hsieh, Kuo-Yu Liao, and Yu-Faye Chao, "Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry," Appl. Opt. 44, 7509-7514 (2005)

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