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Applied Optics

Applied Optics


  • Vol. 44, Iss. 6 — Feb. 20, 2005
  • pp: 959–965

Wavelet analysis of speckle patterns with a temporal carrier

Yu Fu, Cho Jui Tay, Chenggen Quan, and Hong Miao  »View Author Affiliations

Applied Optics, Vol. 44, Issue 6, pp. 959-965 (2005)

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A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of speckle patterns, using a high-speed CCD camera. To avoid ambiguity in phase estimation, a temporal carrier is generated by a piezoelectric transducer stage in the reference beam of the interferometer. The intensity variation of each pixel on recorded images is then analyzed along the time axis by a robust mathematical tool, i.e., a complex Morlet wavelet transform. After the temporal carrier is removed, the absolute displacement of a vibrating object is obtained without the need for temporal or spatial phase unwrapping. The results obtained by a wavelet transform are compared with those from a temporal Fourier transform.

© 2005 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis

Original Manuscript: August 16, 2004
Revised Manuscript: October 29, 2004
Manuscript Accepted: November 4, 2004
Published: February 20, 2005

Yu Fu, Cho Jui Tay, Chenggen Quan, and Hong Miao, "Wavelet analysis of speckle patterns with a temporal carrier," Appl. Opt. 44, 959-965 (2005)

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