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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 7 — Mar. 1, 2005
  • pp: 1141–1149

Uncertainty analysis of displacements measured by in-plane electronic speckle-pattern interferometry with spherical wave fronts

Amalia Martínez, Raúl Cordero, Juan Antonio Rayas, Héctor José Puga, and Ramón Rodríguez-Vera  »View Author Affiliations


Applied Optics, Vol. 44, Issue 7, pp. 1141-1149 (2005)
http://dx.doi.org/10.1364/AO.44.001141


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Abstract

Displacement measurements by optical interferometry depend on the induced phase difference and on the interferometer’s sensitivity vector; the latter depends in turn on the illuminating sources and on the geometry of the optical arrangement. We have performed an uncertainty analysis of the in-plane displacements measured by electronic speckle-pattern interferometry with spherical incident wave fronts. We induced the displacements by applying a uniaxial tensile load on a nominally flat elastic sample. We approached the displacement uncertainty by propagating the uncertainties that we considered reasonable to assign to the measured phase difference and to the characteristic parameters of the interferometer’s sensitivity vector. Special attention was paid to evaluating contributions to the displacement uncertainty. Moreover, we observed that the uncertainty decreases if the angles of incidence and the source–target distances are increased.

© 2005 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
(150.3040) Machine vision : Industrial inspection

History
Original Manuscript: June 15, 2004
Revised Manuscript: November 1, 2004
Manuscript Accepted: November 4, 2004
Published: March 1, 2005

Citation
Amalia Martínez, Raúl Cordero, Juan Antonio Rayas, Héctor José Puga, and Ramón Rodríguez-Vera, "Uncertainty analysis of displacements measured by in-plane electronic speckle-pattern interferometry with spherical wave fronts," Appl. Opt. 44, 1141-1149 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-7-1141


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References

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