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Applied Optics

Applied Optics


  • Vol. 44, Iss. 9 — Mar. 21, 2005
  • pp: 1543–1547

Comparative analysis of techniques for measuring the modulation transfer functions of charge-coupled devices based on the generation of laser speckle

Antonio Manuel Pozo and Manuel Rubiño  »View Author Affiliations

Applied Optics, Vol. 44, Issue 9, pp. 1543-1547 (2005)

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Two methods for measuring the modulation transfer function (MTF) of a charge-coupled device (CCD) that are based on the generation of laser speckle are analyzed and compared. The method based on a single-slit aperture is a quick method, although the measurements are limited to values of less than the Nyquist frequency of the device. The double-slit method permits the measurement of values of as much as some 1.8 times the Nyquist frequency, although it is a slower method because of the necessity to move the CCD. The difference between the MTF values obtained with the two methods is less than 0.1 in magnitude; the root-mean-square error between the two curves is 0.046 (4.6%).

© 2005 Optical Society of America

Original Manuscript: July 29, 2004
Revised Manuscript: November 9, 2004
Manuscript Accepted: November 11, 2004
Published: March 20, 2005

Antonio Manuel Pozo and Manuel Rubiño, "Comparative analysis of techniques for measuring the modulation transfer functions of charge-coupled devices based on the generation of laser speckle," Appl. Opt. 44, 1543-1547 (2005)

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