Multiple-wave lateral shearing interferometry for wave-front sensing
Applied Optics, Vol. 44, Issue 9, pp. 1559-1571 (2005)
http://dx.doi.org/10.1364/AO.44.001559
Acrobat PDF (1541 KB)
Abstract
Multiple-wave achromatic interferometric techniques are used to measure, with high accuracy and high transverse resolution, wave fronts of polychromatic light sources. The wave fronts to be measured are replicated by a diffraction grating into several copies interfering together, leading to an interference pattern. A CCD detector located in the vicinity of the grating records this interference pattern. Some of these wave-front sensors are able to resolve wave-front spatial frequencies 3 to 4 times higher than a conventional Shack-Hartmann technique using an equivalent CCD detector. Its dynamic is also much higher, 2 to 3 orders of magnitude.
© 2005 Optical Society of America
OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.4790) Fourier optics and signal processing : Spectrum analysis
(070.5010) Fourier optics and signal processing : Pattern recognition
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(350.5030) Other areas of optics : Phase
Citation
J.-C. Chanteloup, "Multiple-wave lateral shearing interferometry for wave-front sensing," Appl. Opt. 44, 1559-1571 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-9-1559
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