Multiple-wave achromatic interferometric techniques are used to measure, with high accuracy and high transverse resolution, wave fronts of polychromatic light sources. The wave fronts to be measured are replicated by a diffraction grating into several copies interfering together, leading to an interference pattern. A CCD detector located in the vicinity of the grating records this interference pattern. Some of these wave-front sensors are able to resolve wave-front spatial frequencies 3 to 4 times higher than a conventional Shack–Hartmann technique using an equivalent CCD detector. Its dynamic is also much higher, 2 to 3 orders of magnitude.
© 2005 Optical Society of America
Original Manuscript: April 2, 2004
Revised Manuscript: October 2, 2004
Manuscript Accepted: October 7, 2004
Published: March 20, 2005
J.-C. Chanteloup, "Multiple-wave lateral shearing interferometry for wave-front sensing," Appl. Opt. 44, 1559-1571 (2005)