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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 10 — Apr. 1, 2006
  • pp: 2331–2343

Inversion of irradiance and remote sensing reflectance in shallow water between 400 and 800 nm for calculations of water and bottom properties

Andreas Albert and Peter Gege  »View Author Affiliations


Applied Optics, Vol. 45, Issue 10, pp. 2331-2343 (2006)
http://dx.doi.org/10.1364/AO.45.002331


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Abstract

What we believe to be a new inversion procedure for multi- and hyperspectral data in shallow water, represented by the subsurface irradiance and remote sensing reflectance spectra, was developed based on analytical equations by using the method of nonlinear curve fitting. The iteration starts using an automatic determination of the initial values of the fit parameters: concentration of phytoplankton and suspended matter, absorption of gelbstoff, bottom depth, and the fractions of up to six bottom types. Initial values of the bottom depth and suspended matter concentration are estimated analytically. Phytoplankton concentration and gelbstoff absorption are initially calculated by the method of nested intervals. A sensitivity analysis was made to estimate the accuracy of the entire inversion procedure including model error, error propagation, and influence of instrument characteristics such as noise, and radiometric and spectral resolution. The entire inversion technique is included in a public-domain software (WASI) to provide a fast and user-friendly tool of forward and inverse modeling.

© 2006 Optical Society of America

OCIS Codes
(010.4450) Atmospheric and oceanic optics : Oceanic optics
(280.0280) Remote sensing and sensors : Remote sensing and sensors

ToC Category:
Remote Sensing

History
Original Manuscript: March 18, 2005
Revised Manuscript: July 1, 2005
Manuscript Accepted: July 8, 2005

Citation
Andreas Albert and Peter Gege, "Inversion of irradiance and remote sensing reflectance in shallow water between 400 and 800 nm for calculations of water and bottom properties," Appl. Opt. 45, 2331-2343 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-10-2331


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