Development of high-throughput, polarization-maintaining, near-field probes
Applied Optics, Vol. 45, Issue 12, pp. 2597-2600 (2006)
http://dx.doi.org/10.1364/AO.45.002597
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Abstract
A novel, chemical-etching technique produces very high throughput, polarization-maintaining probes for near-field, scanning, optical microscopy (NSOM). The process includes coating the tips with aluminum and forming the apertures with a focused ion beam (FIB). The elliptical core fibers used resulted in elliptical apertures for the probes. The throughput of the probes depends on the incident polarization. For polarization parallel to the minor axis, the tip presents an insertion loss of only
© 2006 Optical Society of America
OCIS Codes
(110.1220) Imaging systems : Apertures
(180.5810) Microscopy : Scanning microscopy
(230.4000) Optical devices : Microstructure fabrication
History
Original Manuscript: July 18, 2005
Revised Manuscript: November 11, 2005
Manuscript Accepted: November 16, 2005
Virtual Issues
Vol. 1, Iss. 5 Virtual Journal for Biomedical Optics
Citation
Vivekananda P. Adiga, Paul W. Kolb, Geoffrey T. Evans, Max A. Cubillos-Moraga, Don C. Schmadel, Richard Dyott, and H. Dennis Drew, "Development of high-throughput, polarization-maintaining, near-field probes," Appl. Opt. 45, 2597-2600 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-12-2597
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