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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 13 — May. 1, 2006
  • pp: 2940–2954

Multitaper scan-free spectrum estimation using a rotational shear interferometer

Kyle Lepage, David J. Thomson, Shawn Kraut, and David J. Brady  »View Author Affiliations


Applied Optics, Vol. 45, Issue 13, pp. 2940-2954 (2006)
http://dx.doi.org/10.1364/AO.45.002940


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Abstract

Multitaper methods for a scan-free spectrum estimation that uses a rotational shear interferometer are investigated. Before source spectra can be estimated the sources must be detected. A source detection algorithm based upon the multitaper F-test is proposed. The algorithm is simulated, with additive, white Gaussian detector noise. A source with a signal-to-noise ratio (SNR) of 0.71 is detected 2.9° from a source with a SNR of 70.1, with a significance level of 10 4 , ∼4 orders of magnitude more significant than the source detection obtained with a standard detection algorithm. Interpolation and the use of prewhitening filters are investigated in the context of rotational shear interferometer (RSI) source spectra estimation. Finally, a multitaper spectrum estimator is proposed, simulated, and compared with untapered estimates. The multitaper estimate is found via simulation to distinguish a spectral feature with a SNR of 1.6 near a large spectral feature. The SNR of 1.6 spectral feature is not distinguished by the untapered spectrum estimate. The findings are consistent with the strong capability of the multitaper estimate to reduce out-of-band spectral leakage.

© 2006 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Spectroscopy

History
Original Manuscript: September 8, 2005
Manuscript Accepted: November 18, 2005

Citation
Kyle Lepage, David J. Thomson, Shawn Kraut, and David J. Brady, "Multitaper scan-free spectrum estimation using a rotational shear interferometer," Appl. Opt. 45, 2940-2954 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-13-2940

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