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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 16 — Jun. 1, 2006
  • pp: 3746–3751

Millimeter-wave antireflection coating for cryogenic silicon lenses

Judy Lau, Joseph Fowler, Tobias Marriage, Lyman Page, Jon Leong, Edward Wishnow, Ross Henry, Ed Wollack, Mark Halpern, Danica Marsden, and Gaelen Marsden  »View Author Affiliations

Applied Optics, Vol. 45, Issue 16, pp. 3746-3751 (2006)

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We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5 % at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4   K . We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.

© 2006 Optical Society of America

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.4840) Optical design and fabrication : Testing

Original Manuscript: August 31, 2005
Revised Manuscript: October 15, 2005
Manuscript Accepted: October 26, 2005

Judy Lau, Joseph Fowler, Tobias Marriage, Lyman Page, Jon Leong, Edward Wishnow, Ross Henry, Ed Wollack, Mark Halpern, Danica Marsden, and Gaelen Marsden, "Millimeter-wave antireflection coating for cryogenic silicon lenses," Appl. Opt. 45, 3746-3751 (2006)

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