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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 17 — Jun. 10, 2006
  • pp: 3991–3997

Apparent violation of the radiant exposure reciprocity law in interline CCDs

Alejandro Ferrero, Joaquin Campos, and Alicia Pons  »View Author Affiliations

Applied Optics, Vol. 45, Issue 17, pp. 3991-3997 (2006)

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We analyze in detail the apparent violation of the reciprocity law that occurs for an interline CCD array owing to its responsivity that varies with exposure time, and we investigate other parameters having an influence on this variation, such as the numerical aperture of the system or the illumination wavelength. The variation can be explained from a qualitative point of view by the charge leakage that occurs from the sense region to the register region during readout time. This change of the responsivity can be avoided either by using a synchronized external shutter or by limiting the numerical aperture while keeping relatively high exposure times. A detailed characterization for each particular CCD model must be carried out if it is to be employed in low-uncertainty radiometric measurements.

© 2006 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(120.5630) Instrumentation, measurement, and metrology : Radiometry

Original Manuscript: July 26, 2005
Revised Manuscript: November 25, 2005
Manuscript Accepted: December 1, 2005

Alejandro Ferrero, Joaquin Campos, and Alicia Pons, "Apparent violation of the radiant exposure reciprocity law in interline CCDs," Appl. Opt. 45, 3991-3997 (2006)

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