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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 19 — Jul. 1, 2006
  • pp: 4583–4590

Flatfielding in spatial heterodyne spectroscopy

Christoph R. Englert and John M. Harlander  »View Author Affiliations


Applied Optics, Vol. 45, Issue 19, pp. 4583-4590 (2006)
http://dx.doi.org/10.1364/AO.45.004583


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Abstract

Spatial heterodyne spectroscopy (SHS) is a Fourier-transform spectroscopic technique that simultaneously records all path differences using a detector array. Compared to conventional Fourier-transform spectroscopy that measures interferogram samples sequentially in the time domain, SHS is insensitive to a changing scene; however, the effects caused by differences in the detector elements and∕or the optics for each sample must be addressed with a flatfield correction. The flatfield correction is typically a characteristic of the instrument and does not change with the observed scene. We present three different flatfielding approaches. Each is based on different assumptions and is applicable depending on the instrumental effects dominating the flatfield.

© 2006 Optical Society of America

OCIS Codes
(040.5160) Detectors : Photodetectors
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

History
Original Manuscript: October 20, 2005
Revised Manuscript: December 14, 2005
Manuscript Accepted: December 27, 2005

Citation
Christoph R. Englert and John M. Harlander, "Flatfielding in spatial heterodyne spectroscopy," Appl. Opt. 45, 4583-4590 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-19-4583

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