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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 20 — Jul. 10, 2006
  • pp: 4815–4820

Surface contouring by optical edge projection based on a continuous wavelet transform

Chenggen Quan, Hong Miao, and Yu Fu  »View Author Affiliations


Applied Optics, Vol. 45, Issue 20, pp. 4815-4820 (2006)
http://dx.doi.org/10.1364/AO.45.004815


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Abstract

A novel optical edge projection method for surface contouring of an object with low reflectivity is presented. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The surface profile of the object is then evaluated by an active triangular projection technique, and a whole-field three-dimensional contour of the object is obtained by scanning the optical edge over the entire object surface. An edge detection method based on a continuous wavelet transform (CWT) is employed to determine the location of the optical edge. The method of optical edge detection is described, and characteristic details of gray-level distribution along the edge are analyzed. It is shown that the proposed wavelet edge detection method is not dependent on any threshold values; hence the true edge position can be determined without subjective selection. A black low-reflectivity object surface made from woven carbon fiber is measured, and the experimental results show that the profile of a woven carbon fiber can be obtained by the proposed method.

© 2006 Optical Society of America

OCIS Codes
(100.7410) Image processing : Wavelets
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

History
Original Manuscript: July 26, 2005
Revised Manuscript: December 2, 2005
Manuscript Accepted: February 17, 2006

Citation
Chenggen Quan, Hong Miao, and Yu Fu, "Surface contouring by optical edge projection based on a continuous wavelet transform," Appl. Opt. 45, 4815-4820 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-20-4815


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References

  1. J. D. Hovanesian and Y. Y. Hung, "Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects," Appl. Opt. 10, 2734-2738 (1971). [CrossRef] [PubMed]
  2. M. Idesawa and T. Yatagai, "Scanning moiré method and automatic measurement of 3-D shapes," Appl. Opt. 16, 2152-2162 (1977). [CrossRef] [PubMed]
  3. C. Quan and P. J. Bryanston-Cross, "Double-source holographic contouring using fibre optics," Opt. Laser Technol. 22, 255-259 (1990). [CrossRef]
  4. D. R. Burton and M. J. Lalor, "Multichannel Fourier fringe analysis as an aid to automatic phase unwrapping," Appl. Opt. 33, 2939-2948 (1994). [CrossRef] [PubMed]
  5. C. Quan, C. J. Tay, and H. M. Shang, "Fringe projection technique for the 3-D shape measurement of a hydroformed shell," J. Mater. Process Technol. 89-90, 88-91 (1999). [CrossRef]
  6. V. Srinivasan and H. C. Liu, "Automated phase-measuring profilometry of 3-D diffuse objects," Appl. Opt. 23, 3105-3108 (1984). [CrossRef] [PubMed]
  7. X. Y. Su and W. S. Zhou, "Automated phase-measuring profilometry using defocused projection of a Ronchi grating," Opt. Commun. 94, 561-573 (1992). [CrossRef]
  8. H. M. Shang and Y. Y. Hung, "Surface profiling using shearography," Opt. Eng. 39, 23-31 (2000). [CrossRef]
  9. P. K. Rastogi, "Determination of surface strains by speckle shear photography," Opt. Laser Eng. 29, 103-116 (1998). [CrossRef]
  10. C. Quan, X. Y. He, and C. J. Tay, "Shape measurement of small objects using LCD fringe projection with phase shifting," Opt. Commun. 189, 21-29 (2001). [CrossRef]
  11. C. Quan, C. J. Tay, and X. Y. He, "Microscopic surface contouring by fringe projection method," Opt. Laser Technol. 34, 547-552 (2002). [CrossRef]
  12. H. Miao, C. Quan, C. J. Tay, and X. P. Wu, "Profilometry using optical edge projection," in Acousto-Optics and Applications V, T. Klinkosz, B. B. J. Linde, A. Sikorska, and A. Sliwinski, eds., Proc. SPIE 5828, 169-174 (2004).
  13. H. Miao, C. Quan, C. J. Tay, Y. Fu, and X. P. Wu, "Optical edge projection for surface contouring," Opt. Commun. 256, 16-23 (2005). [CrossRef]
  14. J. F. Canny, "A computational approach to edge detection," IEEE Trans. Pattern Anal. Mach. Intell. 8, 679-698 (1986). [CrossRef] [PubMed]
  15. I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, 1992). [CrossRef]
  16. J. H. Kaspersen, T. Lango, and F. Lindseth, "Wavelet-based edge detection in ultrasound images," Ultrasound Med. Biol. 27, 89-99 (2001). [CrossRef] [PubMed]

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