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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 20 — Jul. 10, 2006
  • pp: 4815–4820

Surface contouring by optical edge projection based on a continuous wavelet transform

Chenggen Quan, Hong Miao, and Yu Fu  »View Author Affiliations

Applied Optics, Vol. 45, Issue 20, pp. 4815-4820 (2006)

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A novel optical edge projection method for surface contouring of an object with low reflectivity is presented. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The surface profile of the object is then evaluated by an active triangular projection technique, and a whole-field three-dimensional contour of the object is obtained by scanning the optical edge over the entire object surface. An edge detection method based on a continuous wavelet transform (CWT) is employed to determine the location of the optical edge. The method of optical edge detection is described, and characteristic details of gray-level distribution along the edge are analyzed. It is shown that the proposed wavelet edge detection method is not dependent on any threshold values; hence the true edge position can be determined without subjective selection. A black low-reflectivity object surface made from woven carbon fiber is measured, and the experimental results show that the profile of a woven carbon fiber can be obtained by the proposed method.

© 2006 Optical Society of America

OCIS Codes
(100.7410) Image processing : Wavelets
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: July 26, 2005
Revised Manuscript: December 2, 2005
Manuscript Accepted: February 17, 2006

Chenggen Quan, Hong Miao, and Yu Fu, "Surface contouring by optical edge projection based on a continuous wavelet transform," Appl. Opt. 45, 4815-4820 (2006)

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