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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 22 — Aug. 1, 2006
  • pp: 5636–5641

Fourier transform approach for thickness estimation of reflecting interference filters

Pierre G. Verly  »View Author Affiliations


Applied Optics, Vol. 45, Issue 22, pp. 5636-5641 (2006)
http://dx.doi.org/10.1364/AO.45.005636


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Abstract

An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are proposed and justified by numerical examples.

© 2006 Optical Society of America

OCIS Codes
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties
(350.2460) Other areas of optics : Filters, interference

ToC Category:
Thin Films

History
Original Manuscript: November 28, 2005
Manuscript Accepted: February 7, 2006

Citation
Pierre G. Verly, "Fourier transform approach for thickness estimation of reflecting interference filters," Appl. Opt. 45, 5636-5641 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-22-5636

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