Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Fourier transform approach for thickness estimation of reflecting interference filters

Not Accessible

Your library or personal account may give you access

Abstract

An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are proposed and justified by numerical examples.

© 2006 Optical Society of America

Full Article  |  PDF Article
More Like This
Discrete-Fourier-transform approach to inhomogeneous layer synthesis

Alexander V. Tikhonravov, Brian T. Sullivan, and Maia V. Borisova
Appl. Opt. 33(22) 5142-5150 (1994)

Optimum phase for rugate filter synthesis by Fourier transforms

Pierre G. Verly
Appl. Opt. 50(9) C124-C128 (2011)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (12)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved