High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera
Applied Optics, Vol. 45, Issue 23, pp. 5845-5855 (2006)
http://dx.doi.org/10.1364/AO.45.005845
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Abstract
A digital speckle pattern interferometer based on a complementary metal-oxide semiconductor
(CMOS) camera is described. The temporal evolution of dynamic deformation is measured using
interframe phase stepping. The flexibility of the CMOS detector is used to identify regions of
interest with full-field time-averaged measurements and then to interrogate those regions with
time-resolved measurements sampled at up to
© 2006 Optical Society of America
OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
History
Original Manuscript: November 9, 2005
Manuscript Accepted: December 30, 2005
Citation
Tao Wu, Julian D. C. Jones, and Andrew J. Moore, "High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera," Appl. Opt. 45, 5845-5855 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-23-5845
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