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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 23 — Aug. 10, 2006
  • pp: 5976–5983

Improvement of resolution for phase retrieval by use of a scanning slit

Nobuharu Nakajima  »View Author Affiliations


Applied Optics, Vol. 45, Issue 23, pp. 5976-5983 (2006)
http://dx.doi.org/10.1364/AO.45.005976


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Abstract

An improved method for resolution of object reconstruction using phase retrieval by use of a scanning slit aperture is proposed. The reconstruction is based on measurements of the Fraunhofer diffraction intensities of wave fields transmitted through a scanning slit in the Fresnel-zone plane of an object. In the improved method, the measurement coordinates of the intensities depend not only on the slit's position used in a previous method but also on the slit's position scaled by the ratio between two distances among the object, Fresnel-zone, and detector planes. The spatial-frequency band for the object reconstruction, which is limited in a previous method by the extent of the Fourier transform of the slit function, can be extended to the bandwidth dependent on the scanning area with the slit. In addition, even in the measurement of the Fresnel diffraction intensities of wave fields transmitted through the slit, the improved resolution can be retained by compensation for a transverse shift of the intensities.

© 2006 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(100.5070) Image processing : Phase retrieval

History
Original Manuscript: December 5, 2005
Revised Manuscript: February 13, 2006
Manuscript Accepted: March 13, 2006

Citation
Nobuharu Nakajima, "Improvement of resolution for phase retrieval by use of a scanning slit," Appl. Opt. 45, 5976-5983 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-23-5976

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