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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 23 — Aug. 10, 2006
  • pp: 6007–6012

Model-independent method for the determination of guiding thin-film optical parameters

Ildar Salakhutdinov, Yuriy Danylyuk, Kalyani Chaganti, Ivan Avrutsky, and Gregory Auner  »View Author Affiliations


Applied Optics, Vol. 45, Issue 23, pp. 6007-6012 (2006)
http://dx.doi.org/10.1364/AO.45.006007


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Abstract

A method for the determination of the optical constants of thin films based on the combination of a waveguide measurement procedure with the spectroscopic measurements made from the UV to the IR is presented. As a test material AlN thin film on sapphire substrates is investigated.

© 2006 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(160.3130) Materials : Integrated optics materials
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: September 20, 2005
Revised Manuscript: January 17, 2006
Manuscript Accepted: March 14, 2006

Citation
Ildar Salakhutdinov, Yuriy Danylyuk, Kalyani Chaganti, Ivan Avrutsky, and Gregory Auner, "Model-independent method for the determination of guiding thin-film optical parameters," Appl. Opt. 45, 6007-6012 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-23-6007

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