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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 25 — Sep. 1, 2006
  • pp: 6342–6348

Scaling vertical-cavity surface-emitting laser reliability for petascale systems

John E. Cunningham, David K. McElfresh, Leon D. Lopez, Dan Vacar, and Ashok V. Krishnamoorthy  »View Author Affiliations


Applied Optics, Vol. 45, Issue 25, pp. 6342-6348 (2006)
http://dx.doi.org/10.1364/AO.45.006342


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Abstract

We evaluate vertical-cavity surface-emitting lasers (VCSELs) reliability for next-generation high-productivity computers wherein several hundreds of terabits of bandwidth are envisioned. VCSEL failure rates are modeled, and an empirical relationship for VCSEL scaling versus bit rate and aperture is presented to explore the reliability of VCSEL-based links. The effects of VSCEL sparing, water cooling, and redundancy at the system level are analyzed.

© 2006 Optical Society of America

OCIS Codes
(060.2360) Fiber optics and optical communications : Fiber optics links and subsystems
(200.4650) Optics in computing : Optical interconnects
(250.7260) Optoelectronics : Vertical cavity surface emitting lasers

History
Original Manuscript: January 13, 2006
Manuscript Accepted: April 16, 2006

Citation
John E. Cunningham, David K. McElfresh, Leon D. Lopez, Dan Vacar, and Ashok V. Krishnamoorthy, "Scaling vertical-cavity surface-emitting laser reliability for petascale systems," Appl. Opt. 45, 6342-6348 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-25-6342

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