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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 25 — Sep. 1, 2006
  • pp: 6442–6456

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

Peter N. Moar, John D. Love, François Ladouceur, and Laurence W. Cahill  »View Author Affiliations

Applied Optics, Vol. 45, Issue 25, pp. 6442-6456 (2006)

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We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results—including losses associated with the metal coating—which can then be used as design rules.

© 2006 Optical Society of America

OCIS Codes
(060.2340) Fiber optics and optical communications : Fiber optics components
(060.2350) Fiber optics and optical communications : Fiber optics imaging
(110.0180) Imaging systems : Microscopy
(170.5810) Medical optics and biotechnology : Scanning microscopy

Original Manuscript: January 4, 2005
Revised Manuscript: August 1, 2005
Manuscript Accepted: August 2, 2005

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Peter N. Moar, John D. Love, François Ladouceur, and Laurence W. Cahill, "Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy," Appl. Opt. 45, 6442-6456 (2006)

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