Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy
Applied Optics, Vol. 45, Issue 25, pp. 6442-6456 (2006)
http://dx.doi.org/10.1364/AO.45.006442
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Abstract
We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results—including losses associated with the metal coating—which can then be used as design rules.
© 2006 Optical Society of America
OCIS Codes
(060.2340) Fiber optics and optical communications : Fiber optics components
(060.2350) Fiber optics and optical communications : Fiber optics imaging
(110.0180) Imaging systems : Microscopy
(170.5810) Medical optics and biotechnology : Scanning microscopy
History
Original Manuscript: January 4, 2005
Revised Manuscript: August 1, 2005
Manuscript Accepted: August 2, 2005
Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics
Citation
Peter N. Moar, John D. Love, François Ladouceur, and Laurence W. Cahill, "Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy," Appl. Opt. 45, 6442-6456 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-25-6442
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