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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 25 — Sep. 1, 2006
  • pp: 6497–6506

Errors of Mueller matrix measurements with a partially polarized light source

Soe-Mie F. Nee  »View Author Affiliations


Applied Optics, Vol. 45, Issue 25, pp. 6497-6506 (2006)
http://dx.doi.org/10.1364/AO.45.006497


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Abstract

The linear errors of Mueller matrix measurements, using a partially polarized light source, have been formulated for imperfections of misalignment, depolarization, and nonideal ellipsometric parameters of the polarimetric components. The error matrices for a source-polarizer system and a source–polarizer–compensator system are derived. A polarized light source, when used with an imperfect polarizer, generates extra errors in addition to those for an unpolarized source. The compensator redistributes these errors to different elements of the error matrix. The errors of the Mueller matrices for the polarizer–sample–analyzer and the polarizer–compensator–sample–analyzer systems are evaluated for a straight through case. This error analysis is applied to a Stokes method and an experiment was performed to show the errors by a polarized light source. This general analysis can be used to evaluate errors for ellipsometry and polarimetry.

© 2006 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization

History
Original Manuscript: October 6, 2005
Revised Manuscript: March 1, 2006
Manuscript Accepted: March 14, 2006

Citation
Soe-Mie F. Nee, "Errors of Mueller matrix measurements with a partially polarized light source," Appl. Opt. 45, 6497-6506 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-25-6497


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