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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 25 — Sep. 1, 2006
  • pp: 6598–6601

Measurement of the terahertz-induced phase shift in electro-optic sampling for an arbitrary biasing phase

Arno Schneider and Peter Günter  »View Author Affiliations


Applied Optics, Vol. 45, Issue 25, pp. 6598-6601 (2006)
http://dx.doi.org/10.1364/AO.45.006598


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Abstract

We present a simple method to correct for nonlinearities in the detection of terahertz (THz) transients by electro-optic sampling. The THz-induced phase shift of the optical probe beam is calibrated with an additional biasing phase from a variable wave plate. All the parameters that are needed for the determination of this phase shift can be directly measured, which makes the method insensitive to errors resulting from residual birefringences of the electro-optic material or imperfections of the wave plate. We show that the THz-induced phase shift is correctly revealed for a wide range of the biasing phase.

© 2006 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.2090) Optical devices : Electro-optical devices
(260.3090) Physical optics : Infrared, far

History
Original Manuscript: January 17, 2006
Manuscript Accepted: April 13, 2006

Citation
Arno Schneider and Peter Günter, "Measurement of the terahertz-induced phase shift in electro-optic sampling for an arbitrary biasing phase," Appl. Opt. 45, 6598-6601 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-25-6598


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