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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 45, Iss. 26 — Sep. 10, 2006
  • pp: 6682–6688

Time-resolved vibration measurement with temporal speckle pattern interferometry

Jochen Kauffmann and Hans J. Tiziani  »View Author Affiliations


Applied Optics, Vol. 45, Issue 26, pp. 6682-6688 (2006)
http://dx.doi.org/10.1364/AO.45.006682


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Abstract

Temporal speckle pattern interferometry (TSPI) is an optical measurement procedurefor measuring the displacement of rough technical surfaces. The time-dependent speckle modulation due to optical path difference changes is tracked during the whole displacement of the surface and then evaluated pointwise without referring to neighboring pixels. This feature allows for its use as independent point sensors. This aspect of incremental phase tracking enables TSPI to be used to measure time-resolved mechanical vibrations. It also reduces the deteriorating effect of the decorrelation. Therefore large displacements can be measured. A concept for an inexpensive fiber-optical point sensor was developed and the theoretical accuracy for vibration measurement was investigated. The TSPI measurement of a loudspeaker membrane is compared with a high-precision vibrometer measurement. The first results show good agreement.

© 2006 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
(280.3340) Remote sensing and sensors : Laser Doppler velocimetry
(280.3420) Remote sensing and sensors : Laser sensors

History
Original Manuscript: February 27, 2006
Manuscript Accepted: April 6, 2006

Citation
Jochen Kauffmann and Hans J. Tiziani, "Time-resolved vibration measurement with temporal speckle pattern interferometry," Appl. Opt. 45, 6682-6688 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-26-6682


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