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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 27 — Sep. 20, 2006
  • pp: 6897–6902

Diffractive element design for resonant scanner angular correction

Jed Khoury, Charles L. Woods, Bahareh Haji-saeed, Dana Pyburn, Sandip K. Sengupta, and John Kierstead  »View Author Affiliations

Applied Optics, Vol. 45, Issue 27, pp. 6897-6902 (2006)

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We propose an optical corrective element with zooming capability to convert nonlinear sinusoidal scanning into linear scanning. Such a device will be useful for linearizing the angular scan of a resonant mirror scanner. The design methodology is to create a graded index of refraction device as the reference design, with its index of refraction parameters based on the propagation of an electromagnetic field in inhomogeneous media. The algorithm for converting this refractive element to the corresponding binary diffractive version is also presented. Design and simulation data are shown.

© 2006 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1380) Diffraction and gratings : Binary optics
(050.1970) Diffraction and gratings : Diffractive optics
(220.0220) Optical design and fabrication : Optical design and fabrication

Original Manuscript: July 18, 2005
Revised Manuscript: April 27, 2006
Manuscript Accepted: May 8, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Jed Khoury, Charles L. Woods, Bahareh Haji-saeed, Dana Pyburn, Sandip K. Sengupta, and John Kierstead, "Diffractive element design for resonant scanner angular correction," Appl. Opt. 45, 6897-6902 (2006)

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  1. J. Khoury, C. L. Woods, B. Haji-saeed, D. Pyburn, S. K. Sengupta, and J. Kierstead, "A mapping approach for image correction and processing for bidirectional resonant scanners," Opt. Eng. (to be published).
  2. GSI Lumonics CRS scanner manual, available for download at http://www.gsilumonics.com/process_download_open/01_optical_scanning/resources/7om025_CRS.pdf.
  3. C. L. Confer and G. J. Burrer, "Linear resonant approach to scanning," in Beam Deflection and Scanning Technologies, L. Beiser and G. F. Marshall, eds., Proc. SPIE 1454 , 215-222 (1991).

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