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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 27 — Sep. 20, 2006
  • pp: 7104–7109

Emissitivity spectra obtained from field and laboratory measurements using the temperature and emissivity separation algorithm

Juan C. Jiménez-Muñoz and José A. Sobrino  »View Author Affiliations


Applied Optics, Vol. 45, Issue 27, pp. 7104-7109 (2006)
http://dx.doi.org/10.1364/AO.45.007104


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Abstract

Surface emissivities play an important role in thermal remote sensing, since knowledge of them is required to estimate land surface temperature with enough accuracy. They are also important in other environmental or geological studies. We show the results obtained for the emissivity spectra of different natural surfaces (water, green, and senescent vegetation) by applying the temperature and emissivity separation (TES) algorithm to ground-based measurements collected at the field with a multiband thermal radiometer. The results have been tested with data included in spectral libraries, and rms errors lower than 0.01 have been found, except for senescent vegetation. Two methods are also proposed to apply the TES algorithm to measurements achieved in the laboratory: (i) by heating the sample and (ii) using a box with reflective walls.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.6780) Instrumentation, measurement, and metrology : Temperature
(120.6810) Instrumentation, measurement, and metrology : Thermal effects

History
Original Manuscript: November 16, 2005
Revised Manuscript: April 21, 2006
Manuscript Accepted: May 4, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Citation
Juan C. Jiménez-Muñoz and José A. Sobrino, "Emissitivity spectra obtained from field and laboratory measurements using the temperature and emissivity separation algorithm," Appl. Opt. 45, 7104-7109 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-27-7104


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