Interferometric tracking of optically trapped probes behind structured surfaces: a phase correction method
Applied Optics, Vol. 45, Issue 28, pp. 7309-7315 (2006)
http://dx.doi.org/10.1364/AO.45.007309
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Abstract
We investigate the influence of an additional scatterer on the tracking signal of an optically trapped particle. The three-dimensional particle position is recorded interferometrically with nanometer precision by using a quadrant photodiode in the back focal plane of a detection lens. A phase disturbance underneath the sample leads to incorrect position signals. The resulting interaction potential and forces are therefore erroneous as well. We present a procedure to correct for the disturbance by measuring its interferometric signal. We prove the applicability of our phase correction approach by generating a defined displacement of the trapped probe.
© 2006 Optical Society of America
OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.7010) Lasers and laser optics : Laser trapping
(180.3170) Microscopy : Interference microscopy
(290.0290) Scattering : Scattering
(290.5850) Scattering : Scattering, particles
ToC Category:
Scattering
History
Original Manuscript: February 23, 2006
Manuscript Accepted: April 20, 2006
Virtual Issues
Vol. 1, Iss. 11 Virtual Journal for Biomedical Optics
Citation
Peter C. Seitz, Ernst H. K. Stelzer, and Alexander Rohrbach, "Interferometric tracking of optically trapped probes behind structured surfaces: a phase correction method," Appl. Opt. 45, 7309-7315 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-28-7309
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