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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 28 — Oct. 1, 2006
  • pp: 7392–7400

Performance evaluation of partial differential equation models in electronic speckle pattern interferometry and the δ-mollification phase map method

Chen Tang, Fang Zhang, Botao Li, and Haiqing Yan  »View Author Affiliations


Applied Optics, Vol. 45, Issue 28, pp. 7392-7400 (2006)
http://dx.doi.org/10.1364/AO.45.007392


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Abstract

The ordinary differential equation (ODE) and partial differential equation (PDE) image- processing methods have been applied to reduce noise and enhance the contrast of electronic speckle pattern interferometry fringe patterns. We evaluate the performance of a few representative PDE denoising models quantitatively with two parameters called image fidelity and speckle index, and then we choose a good denoising model. Combining this denoising model with the ODE enhancement method, we make it possible to perform contrast enhancement and denoising simultaneously. Second, we introduce the δ-mollification method to smooth the unwrapped phase map. Finally, based on PDE image processing, δ mollification and some traditional techniques, an approach of phase extraction from a single fringe pattern is tested for computer-simulated and experimentally obtained fringe patterns. The method works well under a high noise level and limited visibility and can extract accurate phase values.

© 2006 Optical Society of America

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(100.5010) Image processing : Pattern recognition
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 3, 2006
Revised Manuscript: April 20, 2006
Manuscript Accepted: April 21, 2006

Citation
Chen Tang, Fang Zhang, Botao Li, and Haiqing Yan, "Performance evaluation of partial differential equation models in electronic speckle pattern interferometry and the δ-mollification phase map method," Appl. Opt. 45, 7392-7400 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-28-7392

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