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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 29 — Oct. 10, 2006
  • pp: 7602–7609

Two-wavelength Talbot effect and its application for three-dimensional step-height measurement

Dalip Singh Mehta, Satish Kumar Dubey, Chandra Shakher, and Mitsuo Takeda  »View Author Affiliations


Applied Optics, Vol. 45, Issue 29, pp. 7602-7609 (2006)
http://dx.doi.org/10.1364/AO.45.007602


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Abstract

The phenomenon of Talbot self-image shift by changing the wavelength of the illuminating light is described and demonstrated experimentally. A periodic grating is illuminated by light with wavelengths λ 1 and λ 2 generated by two lasers, and the Talbot self-images are recorded along the longitudinal direction at individual wavelengths. The Talbot self-image shift due to the change in the wavelength of light is implemented for the measurement of the three-dimensional step height of a large discontinuous object without any phase ambiguity problem. Fourier-transform fringe analysis was used to determine the maximum contrast of the high-visibility bands for the measurement of the step height of the object. The main advantages of the proposed system are nonmechanical scanning, high stability because of its common path geometry, compactness, and a wide range of measurement as compared to interferometric three- dimensional profilers.

© 2006 Optical Society of America

OCIS Codes
(110.6760) Imaging systems : Talbot and self-imaging effects
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

History
Original Manuscript: February 9, 2006
Revised Manuscript: April 19, 2006
Manuscript Accepted: May 30, 2006

Citation
Dalip Singh Mehta, Satish Kumar Dubey, Chandra Shakher, and Mitsuo Takeda, "Two-wavelength Talbot effect and its application for three-dimensional step-height measurement," Appl. Opt. 45, 7602-7609 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-29-7602


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