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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 29 — Oct. 10, 2006
  • pp: 7610–7616

Surface shape measurement by phase-shifting digital holography with a wavelength shift

Ichirou Yamaguchi, Takashi Ida, Masayuki Yokota, and Kouji Yamashita  »View Author Affiliations

Applied Optics, Vol. 45, Issue 29, pp. 7610-7616 (2006)

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Surface contouring by phase-shifting digital holography is proposed and verified by experiments and numerical simulations. Digital holograms are recorded before and after mode hopping of a laser diode subject to current tuning, and the difference of the reconstructed phases at each wavelength is computed to deliver surface contours of a diffusely reflecting surface. Since normal incidence on the object is employed, the method does not need the removal of the tilt component and is free from the shadowing effect as advantages over the dual-incidence method proposed before by the first author.

© 2006 Optical Society of America

OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(100.2000) Image processing : Digital image processing
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: February 9, 2006
Revised Manuscript: May 12, 2006
Manuscript Accepted: May 18, 2006

Ichirou Yamaguchi, Takashi Ida, Masayuki Yokota, and Kouji Yamashita, "Surface shape measurement by phase-shifting digital holography with a wavelength shift," Appl. Opt. 45, 7610-7616 (2006)

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