OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 31 — Nov. 1, 2006
  • pp: 8006–8012

Full-field heterodyne polariscope with an image signal processing method for principal axis and phase retardation measurements

Yu-Lung Lo, Hung-Wei Chih, Cheng-Yen Yeh, and Tsung-Chih Yu  »View Author Affiliations


Applied Optics, Vol. 45, Issue 31, pp. 8006-8012 (2006)
http://dx.doi.org/10.1364/AO.45.008006


View Full Text Article

Enhanced HTML    Acrobat PDF (3229 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We develop a heterodyne polariscope for measuring the two-dimensional principal axis and phase retardation in a linear birefringence material using novel three-frame and two-frame integrating-bucket methods and a CCD. By using a complex programmable logic device to provide an external trigger to the CCD, integrating buckets with multiple frames are achieved. The advantages of the proposed three-frame and two-frame integrating-bucket methods include a simpler signal processing algorithm based on fewer frames and the elimination of flyback error caused by a sawtooth modulation signal at higher frequencies.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

History
Original Manuscript: March 3, 2006
Revised Manuscript: June 13, 2006
Manuscript Accepted: June 18, 2006

Citation
Yu-Lung Lo, Hung-Wei Chih, Cheng-Yen Yeh, and Tsung-Chih Yu, "Full-field heterodyne polariscope with an image signal processing method for principal axis and phase retardation measurements," Appl. Opt. 45, 8006-8012 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-31-8006


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. F. L. Clerc, L. Collot, and M. Gross, "Numerical heterodyne holography with two-dimensional photodetector arrays," Opt. Lett. 25, 716-718 (2000). [CrossRef]
  2. M. Akiba, K. P. Chan, and N. Tanno, "Real-time, micrometer depth resolved imaging by low-coherence reflectometry and a two-dimensional heterodyne detection technique," Jpn. J. Appl. Phys. Part 2 39, L1194-L1196 (2000). [CrossRef]
  3. T. Suzuki, T. Maki, X. Zhao, and O. Sasaki, "Disturbance-free high-speed sinusoidal phase-modulating laser diode interferometer," Appl. Opt. 41, 1949-1953 (2002). [CrossRef] [PubMed]
  4. O. Sasaki, H. Okazaki, and M. Sakai, "Sinusoidal phase modulating interferometer using the integrating-bucket method," Appl. Opt. 26, 1089-1093 (1987). [CrossRef] [PubMed]
  5. T. Spirig, P. Seitx, O. Vietze, and F. Heitger, "The lock-in CCD two-dimensional synchronous detection of light," IEEE J. Quantum Electron. 31, 1705-1708 (1995). [CrossRef]
  6. A. Dubois, "Phase-map measurements by interferometry with sinusoidal phase modulation and four integrating buckets," J. Opt. Soc. Am. A 18, 1972-1979 (2001). [CrossRef]
  7. Y.-L. Lo, C.-H. Lai, J.-F. Lin, and P.-F. Hsu, "Simultaneous absolute measurements of principal angle and phase retardation with a new common-path heterodyne interferometer," Appl. Opt. 43, 2013-2022 (2004). [CrossRef] [PubMed]
  8. T. Suzuki, T. Yazawa, and O. Sasaki, "Two-wavelength laser diode interferometer with time-sharing sinusoidal phase modulation," Appl. Opt. 41, 1972-1976 (2002). [CrossRef] [PubMed]
  9. T. Suzuki, O. Sasaki, J. Kaneda, and T. Maruyama, "Real-time two-dimensional surface profile measurement in sinusoidal phase modulating laser diode interferometer," Opt. Eng. 33, 2754-2759 (1994). [CrossRef]
  10. C. Chou, J.-C. Shyu, Y. C. Huang, and C. K. Yuan, "Common-path optical heterodyne profilometer: a configuration," Appl. Opt. 37, 4137-4142 (1998). [CrossRef]
  11. M. V. Aguanno, F. Lakestani, M. P. Whelan, and M. J. Connelly, "Single-pixel carrier-based approach for full-field laser interferometry using a CMOS-DSP camera," in Detectors and Associated Signal Processing, J.-P. Chatard and P. N. Dennis, eds., Proc. SPIE , 5251, 304-312 (2004). [CrossRef]
  12. P. Hariharan, B. F. Orbel, and T. Eiju, "Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm," Appl. Opt. 26, 2504-2505 (1987). [CrossRef] [PubMed]
  13. Y. L. Lo, S. Y. Lee, and J. F. Lin, "The new circular polariscope and the Senarmont setup with electro-optic modulation for measuring the optical linear birefringent media properties," Opt. Commun. 237, 267-273 (2004). [CrossRef]
  14. K. D. Stumpf, "Real-time interferometer," Opt. Eng. 18, 648-653 (1979).
  15. I. L. Lee, "Design and construction of a full-field three-dimensional transient strain metrology system," Master's thesis (Institute of Applied Mechanics, National Taiwan University, 2004).
  16. C. P. Brophy, "Effect of intensity error correlation on the computed phase of phase-shifting interferometry," J. Opt. Soc. Am. A. 7, 537-541 (1990). [CrossRef]
  17. K. B. Rochford, A. H. Rose, and C. M. Wang, "NIST study investigates retardance uncertainty," Laser Focus World 33(5), 223-227 (1997).
  18. Y. L. Lo and T. C. Yu, "A polarimetric glucose sensor using a liquid-crystal polarization modulator driven by a sinusoidal signal," Opt. Commun. 259, 40-48 (2006). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited