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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 34 — Dec. 1, 2006
  • pp: 8613–8620

Electronically swept millimeter-wave interferometer for spatially resolved measurement of plasma electron density

John Howard and David Oliver  »View Author Affiliations


Applied Optics, Vol. 45, Issue 34, pp. 8613-8620 (2006)
http://dx.doi.org/10.1364/AO.45.008613


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Abstract

We report the development and initial implementation of what we believe to be a new rapid- spatial-scan millimeter-wave interferometer for plasma density measurements. The fast scan is effected by electronic frequency sweeping of a wideband ( 180 280   GHz ) backward-wave oscillator whose output is focused onto a fixed blazed diffraction grating. The system, which augments the rotating-grating scanned multiview H-1 heliac interferometer, can sweep the plasma cross section in a period of less than 1 ms with a beam diameter in the plasma of 20   mm and phase noise of the order of 0.01   rad .

© 2006 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(350.5400) Other areas of optics : Plasmas

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 10, 2006
Revised Manuscript: July 17, 2006
Manuscript Accepted: July 21, 2006

Citation
John Howard and David Oliver, "Electronically swept millimeter-wave interferometer for spatially resolved measurement of plasma electron density," Appl. Opt. 45, 8613-8620 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-34-8613

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