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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 35 — Dec. 10, 2006
  • pp: 8848–8854

Phase unwrapping method for three-dimensional stress analysis by scattered-light photoelasticity with unpolarized light

Toshiki Kihara  »View Author Affiliations


Applied Optics, Vol. 45, Issue 35, pp. 8848-8854 (2006)
http://dx.doi.org/10.1364/AO.45.008848


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Abstract

In scattered-light photoelasticity with unpolarized light, the secondary principal stress direction ψ and the relative phase retardation ρ in a three-dimensional stressed model with rotation of the principal stress axes can be obtained by use of Stokes parameters. For completely automated stress analysis, measurements of the total relative phase retardation and the secondary principal stress direction over the entire field are required, and it is necessary to unwrap ψ and ρ. A phase unwrapping method is thus proposed for the determination of these values based on scattered-light photoelasticity. The values are easily obtained via an arctangent function, overcoming the error associated with the quarter-wave plate by employing an incident light of different wavelengths. The proposed technique provides automated and nondestructive determination of the total relative phase retardation and the secondary principal stress direction in a model exhibiting rotation of the principal stress axes.

© 2006 Optical Society of America

OCIS Codes
(100.3190) Image processing : Inverse problems
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing

History
Original Manuscript: April 12, 2006
Manuscript Accepted: August 9, 2006

Citation
Toshiki Kihara, "Phase unwrapping method for three-dimensional stress analysis by scattered-light photoelasticity with unpolarized light," Appl. Opt. 45, 8848-8854 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-35-8848

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