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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 35 — Dec. 10, 2006
  • pp: 8863–8869

Phase-step calibration technique based on a two-run-times-two-frame phase-shift method

Xianghong Zhong  »View Author Affiliations

Applied Optics, Vol. 45, Issue 35, pp. 8863-8869 (2006)

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A novel phase-step calibration technique is presented on the basis of a two-run-times-two-frame phase-shift method. First the symmetry factor M is defined to describe the distribution property of the distorted phase due to phase-shifter miscalibration; then the phase-step calibration technique, in which two sets of two interferograms with a straight fringe pattern are recorded and the phase step is obtained by calculating M of the wrapped phase map, is developed. With this technique, a good mirror is required, but no uniform illumination is needed and no complex mathematical operation is involved. This technique can be carried out in situ and is applicable to any phase shifter, whether linear or nonlinear.

© 2006 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(100.5070) Image processing : Phase retrieval
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Original Manuscript: June 15, 2006
Revised Manuscript: August 25, 2006
Manuscript Accepted: August 29, 2006

Xianghong Zhong, "Phase-step calibration technique based on a two-run-times-two-frame phase-shift method," Appl. Opt. 45, 8863-8869 (2006)

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