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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 35 — Dec. 10, 2006
  • pp: 8999–9006

Transverse-mode control in vertical-cavity surface-emitting lasers via a patterned phase aperture

M. Achtenhagen, A. Hardy, and E. Kapon  »View Author Affiliations


Applied Optics, Vol. 45, Issue 35, pp. 8999-9006 (2006)
http://dx.doi.org/10.1364/AO.45.008999


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Abstract

Transverse-mode discrimination in vertical-cavity surface-emitting lasers that contain a patterned phase aperture is analyzed numerically. The two lowest-order modes are calculated for different aperture shapes and sizes. They are then expanded in Laguerre–Gaussian modes to study the power distribution as well as their beam propagation factor. The mode selection depends on the aperture's size and degree of symmetry. The maximum value for the mode discrimination in the case of a specific phase aperture is determined, and an enhancement by a factor of 3, compared to the case without a phase aperture, is found.

© 2006 Optical Society of America

OCIS Codes
(140.0140) Lasers and laser optics : Lasers and laser optics
(230.0250) Optical devices : Optoelectronics

History
Original Manuscript: January 17, 2006
Revised Manuscript: August 4, 2006
Manuscript Accepted: August 14, 2006

Citation
M. Achtenhagen, A. Hardy, and E. Kapon, "Transverse-mode control in vertical-cavity surface-emitting lasers via a patterned phase aperture," Appl. Opt. 45, 8999-9006 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-35-8999


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