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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 36 — Dec. 20, 2006
  • pp: 9087–9091

Measurements of femtosecond pulse temporal profile by means of a Michelson interferometer with a Schottky junction

Yan Ling and Fang Lu  »View Author Affiliations

Applied Optics, Vol. 45, Issue 36, pp. 9087-9091 (2006)

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We introduce a new method for femtosecond pulse shape measurement. The interference of two pulses is employed rather than the second-harmonic generation (SHG). Usually, the measurements of the femtosecond pulse is realized by an interferometer in combination with a nonlinear optical material, while the measurement that we describe is realized by means of a Michelson interferometer with a Schottky junction. Only a metal–semiconductor junction (Schottky junction) is needed, and neither the nonlinear optical material nor a photodetector is included. The two-photon absorption arises when the light is strong enough, while there is only a one-photon absorption when the light is weak. And the calculations are in good agreement with the experimental results. In principle, the new technique could be used for the measuring of pulses with any duration and with very low power. Unlike the SHG scheme, in the new method the quality of optics, mechanics, and other elements of the scheme are not essential, and the measurement is easily realized, but the results are quite precise and very sensitive to the light.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.1680) Instrumentation, measurement, and metrology : Collimation
(160.6030) Materials : Silica
(320.7100) Ultrafast optics : Ultrafast measurements

Original Manuscript: May 8, 2006
Revised Manuscript: August 16, 2006
Manuscript Accepted: August 21, 2006

Yan Ling and Fang Lu, "Measurements of femtosecond pulse temporal profile by means of a Michelson interferometer with a Schottky junction," Appl. Opt. 45, 9087-9091 (2006)

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