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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 4 — Feb. 1, 2006
  • pp: 678–687

Three-dimensional profilometry based on shift estimation of projected fringe patterns

Yingsong Hu, Jiangtao Xi, Enbang Li, Joe Chicharo, and Zongkai Yang  »View Author Affiliations

Applied Optics, Vol. 45, Issue 4, pp. 678-687 (2006)

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This paper presents a new approach to fringe pattern profilometry. In this paper, a generalized model describing the relationship between the projected fringe pattern and the deformed fringe pattern is derived, in which the projected fringe pattern can be arbitrary rather than being limited to being sinusoidal, as are those for the conventional approaches. Based on this model, what is believed to be a new approach is proposed to reconstruct the three-dimensional object surface by estimating the shift between the projected and deformed fringe patterns. Additionally, theoretical analysis, computer simulation, and experimental results are presented, which show how the proposed approach can significantly improve the measurement accuracy, especially when the fringe patterns are distorted by unknown factors.

© 2006 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 28, 2005
Revised Manuscript: July 1, 2005
Manuscript Accepted: July 5, 2005

Yingsong Hu, Jiangtao Xi, Enbang Li, Joe Chicharo, and Zongkai Yang, "Three-dimensional profilometry based on shift estimation of projected fringe patterns," Appl. Opt. 45, 678-687 (2006)

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