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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 4 — Feb. 1, 2006
  • pp: 756–763

Determination of refractive index profiles of Ag+–Na+ ion-exchange multimode strip waveguides by variable wavefront shear double-refracting interferometry microinterferometry

Piotr Mrozek, Ewa Mrozek, and Tadeusz Lukaszewicz  »View Author Affiliations

Applied Optics, Vol. 45, Issue 4, pp. 756-763 (2006)

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The results of experimental determination of multimode strip waveguide refractive index profiles and Ag concentration profiles obtained by using the variable wavefront shear double-refracting interferometry microinterferometer Biolar PI and an electron microprobe are presented. The strip waveguides under investigation are formed in soda lime glass in an external electric-field-assisted Ag + –Na + ion-exchange process from the molten AgNO 3 salt by use of dielectric masks with channel apertures. A dry electrochemical technique of dielectric mask formation is applied. The influence of waveguide-forming parameters on the shape of Ag concentration profiles and the range of silver diffusion are shown. Changes in the usually assumed boundary conditions of electric-field calculations in ion-exchange numerical modeling are suggested.

© 2006 Optical Society of America

OCIS Codes
(180.3170) Microscopy : Interference microscopy
(230.7380) Optical devices : Waveguides, channeled

ToC Category:
Optical Devices

Original Manuscript: January 13, 2005
Revised Manuscript: June 22, 2005
Manuscript Accepted: June 29, 2005

Piotr Mrozek, Ewa Mrozek, and Tadeusz Lukaszewicz, "Determination of refractive index profiles of Ag+-Na+ ion-exchange multimode strip waveguides by variable wavefront shear double-refracting interferometry microinterferometry," Appl. Opt. 45, 756-763 (2006)

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