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Applied Optics

Applied Optics


  • Vol. 45, Iss. 5 — Feb. 10, 2006
  • pp: 851–863

Automatic procedure for aberration compensation in digital holographic microscopy and applications to specimen shape compensation

Tristan Colomb, Etienne Cuche, Florian Charrière, Jonas Kühn, Nicolas Aspert, Frédéric Montfort, Pierre Marquet, and Christian Depeursinge  »View Author Affiliations

Applied Optics, Vol. 45, Issue 5, pp. 851-863 (2006)

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We present a procedure that compensates for phase aberrations in digital holographic microscopy by computing a polynomial phase mask directly from the hologram. The phase-mask parameters are computed automatically without knowledge of physical values such as wave vectors, focal lengths, or distances. This method enables one to reconstruct correct and accurate phase distributions, even in the presence of strong and high-order aberrations. Examples of applications are shown for microlens imaging and for compensating for the deformations associated with a tilted thick plate. Finally we show that this method allows compensation for the curvature of the specimen, revealing its surface defects and roughness. Examples of applications are shown for microlenses and metallic sphere imaging.

© 2006 Optical Society of America

OCIS Codes
(090.1000) Holography : Aberration compensation
(090.1760) Holography : Computer holography
(120.3620) Instrumentation, measurement, and metrology : Lens system design
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.0180) Microscopy : Microscopy

ToC Category:
Digital/Electronic Holographic Microscopy

Original Manuscript: May 16, 2005
Revised Manuscript: August 11, 2005
Manuscript Accepted: August 17, 2005

Virtual Issues
Vol. 1, Iss. 3 Virtual Journal for Biomedical Optics

Tristan Colomb, Etienne Cuche, Florian Charrière, Jonas Kühn, Nicolas Aspert, Frédéric Montfort, Pierre Marquet, and Christian Depeursinge, "Automatic procedure for aberration compensation in digital holographic microscopy and applications to specimen shape compensation," Appl. Opt. 45, 851-863 (2006)

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