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Applied Optics

Applied Optics


  • Vol. 45, Iss. 5 — Feb. 10, 2006
  • pp: 925–934

Remote metrology by comparative digital holography

Torsten Baumbach, Wolfgang Osten, Christoph von Kopylow, and Werner Jüptner  »View Author Affiliations

Applied Optics, Vol. 45, Issue 5, pp. 925-934 (2006)

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A method for the remote comparison of objects with regard to their shape or response to a load is presented. The method allows interferometric sensitivity for comparing objects with different microstructure. In contrast to the well-known incoherent techniques based on inverse fringe projection this new approach uses the coherent optical wave field of the master object as a mask for the illumination of the sample object. The coherent mask is created by digital holography to allow instant access to the complete optical information of the master object at any place desired. The mask is reconstructed by a spatial light modulator (SLM). The optical reconstruction of digital holograms with SLM technology allows modification of reconstructed wavefronts with respect to improvement of image quality, the skilled introduction of additional information about the object (augmented reality), and the alignment of the master and test object.

© 2006 Optical Society of America

OCIS Codes
(090.1970) Holography : Diffractive optics
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(230.6120) Optical devices : Spatial light modulators

ToC Category:

Original Manuscript: May 20, 2005
Revised Manuscript: August 23, 2005
Manuscript Accepted: August 23, 2005

Torsten Baumbach, Wolfgang Osten, Christoph von Kopylow, and Werner Jüptner, "Remote metrology by comparative digital holography," Appl. Opt. 45, 925-934 (2006)

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