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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 6 — Feb. 20, 2006
  • pp: 1120–1123

Abelès method revisited

Petre C. Logofătu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller  »View Author Affiliations

Applied Optics, Vol. 45, Issue 6, pp. 1120-1123 (2006)

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The Abelès method is a classical method for determining the refractive index of dielectric thin films. In this paper we examine the main features of the method in a formal manner, using closed-form equations, and we show that the method is ambiguous in certain yet unreported situations.

© 2006 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 29, 2005
Manuscript Accepted: October 21, 2005

Petre C. Logofatu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller, "Abelès method revisited," Appl. Opt. 45, 1120-1123 (2006)

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  1. F. Abelès, "Methods for determining optical parameters of thin films," in Progress in Optics, E. Wolf, ed. (North Holland, 1963), Vol. 2, pp. 249-288. [CrossRef]
  2. J. E. Goell and R. D. Standley, "Effect of refractive index gradients on index measurements by the Abelès method," Appl. Opt. 11, 2502-2505 (1972). [CrossRef] [PubMed]
  3. I. Awai and J. Ikenoue, "Effect of film transition layers on the Abelès method," Appl. Opt. 23, 1890-1896 (1984). [CrossRef] [PubMed]
  4. V. Damian, P. C. Logofǎtu, D. Apostol, F. Garoi, I. Iordache, A. Timcu, O. Ligor, and R. Müller, "Polymer thin film refractive index determination," in Proceedings of IEEE 2004 International Semiconductor Conference (IEEE, 2004), pp. 441-444.
  5. M. V. Klein and T. E. Furtak, Optics (Wiley, 1986).

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