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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 6 — Feb. 20, 2006
  • pp: 1120–1123

Abelès method revisited

Petre C. Logofătu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller  »View Author Affiliations


Applied Optics, Vol. 45, Issue 6, pp. 1120-1123 (2006)
http://dx.doi.org/10.1364/AO.45.001120


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Abstract

The Abelès method is a classical method for determining the refractive index of dielectric thin films. In this paper we examine the main features of the method in a formal manner, using closed-form equations, and we show that the method is ambiguous in certain yet unreported situations.

© 2006 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 29, 2005
Manuscript Accepted: October 21, 2005

Citation
Petre C. Logofatu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller, "Abelès method revisited," Appl. Opt. 45, 1120-1123 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-6-1120

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