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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1312–1318

Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem

Fabien Lemarchand, Carole Deumié, Myriam Zerrad, Laëtitia Abel-Tiberini, Bertrand Bertussi, Gaëlle Georges, Basile Lazaridès, Michel Cathelinaud, Michel Lequime, and Claude Amra  »View Author Affiliations


Applied Optics, Vol. 45, Issue 7, pp. 1312-1318 (2006)
http://dx.doi.org/10.1364/AO.45.001312


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Abstract

We present the characterizations performed at the Institut Fresnel for the Measurement Problem of the Optical Interference Coatings 2004 Topical Meeting. A single layer coated on a fused-silica substrate of unknown composition and parameters is analyzed in terms of optogeometrical parameters, uniformity, and scattering. We determine the refractive index and the average thickness of the coating, then provide the localized determination of the thickness with a 2 mm spatial resolution. Topography measurements include atomic force microscopy and angle-resolved scattering measurements. These results are completed thanks to a Taylor Hobson noncontact 3D surface profiler.

© 2006 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties
(310.6870) Thin films : Thin films, other properties

ToC Category:
OIC'2004 Design and Manufacturing Problem Results

History
Original Manuscript: February 28, 2005
Manuscript Accepted: July 14, 2005

Citation
Fabien Lemarchand, Carole Deumié, Myriam Zerrad, Laëtitia Abel-Tiberini, Bertrand Bertussi, Gaëlle Georges, Basile Lazaridès, Michel Cathelinaud, Michel Lequime, and Claude Amra, "Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem," Appl. Opt. 45, 1312-1318 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-7-1312

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