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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1344–1348

Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter

Cheng-Chung Lee, Chien-Cheng Kuo, and Sheng-Hui Chen  »View Author Affiliations

Applied Optics, Vol. 45, Issue 7, pp. 1344-1348 (2006)

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The monitor passband width of an optical monitor is an important parameter for the fabrication of a dense-wavelength-division-multiplexing (DWDM) filter. The peak insertion loss and transmittance of one-cavity narrow-bandpass filters (NBPFs) were analyzed by using different passband widths. The simulation monitoring curves of the last layer of the first, second, third, and fourth cavities of a five-cavity DWDM filter with different monitor passband widths were investigated. The last layer of each cavity is very sensitive to the monitor passband width, showing that the monitor passband width of an optical monitor should be less than half the designed passband width. This analysis demonstrates the successful fabrication of a five-cavity DWDM filter.

© 2006 Optical Society of America

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(310.0310) Thin films : Thin films

ToC Category:

Original Manuscript: February 28, 2005
Revised Manuscript: August 19, 2005
Manuscript Accepted: August 24, 2005

Cheng-Chung Lee, Chien-Cheng Kuo, and Sheng-Hui Chen, "Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter," Appl. Opt. 45, 1344-1348 (2006)

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