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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1344–1348

Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter

Cheng-Chung Lee, Chien-Cheng Kuo, and Sheng-Hui Chen  »View Author Affiliations


Applied Optics, Vol. 45, Issue 7, pp. 1344-1348 (2006)
http://dx.doi.org/10.1364/AO.45.001344


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Abstract

The monitor passband width of an optical monitor is an important parameter for the fabrication of a dense-wavelength-division-multiplexing (DWDM) filter. The peak insertion loss and transmittance of one-cavity narrow-bandpass filters (NBPFs) were analyzed by using different passband widths. The simulation monitoring curves of the last layer of the first, second, third, and fourth cavities of a five-cavity DWDM filter with different monitor passband widths were investigated. The last layer of each cavity is very sensitive to the monitor passband width, showing that the monitor passband width of an optical monitor should be less than half the designed passband width. This analysis demonstrates the successful fabrication of a five-cavity DWDM filter.

© 2006 Optical Society of America

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(310.0310) Thin films : Thin films

ToC Category:
Filters

History
Original Manuscript: February 28, 2005
Revised Manuscript: August 19, 2005
Manuscript Accepted: August 24, 2005

Citation
Cheng-Chung Lee, Chien-Cheng Kuo, and Sheng-Hui Chen, "Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter," Appl. Opt. 45, 1344-1348 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-7-1344


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References

  1. H. A. Macleod, 'Tutorial on the design of telecommunication filters,' presented at the Eighth Optical Interference Coatings Conference, Banff, Alberta, Canada, 15-20 July 2001, paper WC1.
  2. C.-C. Lee, Thin Film Optics and Coating Technologies, 4th ed. (Yi Hsien Publishing, 2004), Chap. 12.
  3. R. R. Willey, 'Achieving narrow bandpass filters which meet the requirements for DWDM,' Thin Solid Films 398-399, 1-9 (2001). [CrossRef]
  4. P. Bousquet, A. Fornier, R. Kowalczak, E. Pelletier, and P. Roche, 'Optical filters: monitoring process allowing the auto-correction of thickness errors,' Thin Solid Films 13, 285-290 (1972). [CrossRef]
  5. R. R. Willey, 'Simulation of errors in the monitoring of narrow bandpass filters,' Appl. Opt. 41, 3193-3195 (2002). [CrossRef] [PubMed]
  6. R. R. Willey, 'Application of a refined error model of turning point monitoring to the simulation of narrow bandpass filter production,' Proc. Soc. Vacuum Coaters 45, 295-298 (2002).
  7. K. Postava, J. Pistora, M. Kojima, K. Kikuchi, K. Endo, and T. Yamaguchi, 'Thickness monitoring of optical filters for DWDM applications,' Opt. Express 11, 610-616 (2003). [CrossRef] [PubMed]

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