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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1416–1424

Simultaneous absorption, scattering, and luminescence mappings for the characterization of optical coatings and surfaces

Laurent Gallais and Mireille Commandré  »View Author Affiliations

Applied Optics, Vol. 45, Issue 7, pp. 1416-1424 (2006)

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An experimental setup, based on the laser-induced deflection technique, is developed to measure simultaneously the 244 nm laser absorption, scattering, and luminescence on optical components. The different techniques and methods that have been specifically developed to obtain both high resolution (micronic) and sensitivity (a few 10-7 of the incident power for the absorption, 10-8 for scattering and fluorescence) are presented. Different applications are then explored: the study of losses in deep UV multilayer coatings (HfO2/SiO2 mirrors) and the analysis of contamination defects on bare substrate and structural defects in optical coatings.

© 2006 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(350.5340) Other areas of optics : Photothermal effects

ToC Category:
Characterization of Optical Coatings

Original Manuscript: March 1, 2005
Manuscript Accepted: June 29, 2005

Laurent Gallais and Mireille Commandré, "Simultaneous absorption, scattering, and luminescence mappings for the characterization of optical coatings and surfaces," Appl. Opt. 45, 1416-1424 (2006)

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