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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1555–1562

Toward perfect antireflection coatings. 3. Experimental results obtained with the use of Reststrahlen materials

J. A. Dobrowolski, Yanen Guo, Tom Tiwald, Penghui Ma, and Daniel Poitras  »View Author Affiliations


Applied Optics, Vol. 45, Issue 7, pp. 1555-1562 (2006)
http://dx.doi.org/10.1364/AO.45.001555


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Abstract

The equipment and methods used to produce wide-angle antireflection coatings based on Reststrahlen materials are described. The optical constants of the coating materials used in the construction of the multilayers were determined by spectrophotometric ellipsometry and are compared with the literature values. The measured performance of an experimentally produced antireflection coating is compared with the expected calculated performance. The reflectance is low over a wide range of angles, but only in the narrow-wavelength region at which the refractive index of the Reststrahlen material is close to unity.

© 2006 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(310.1860) Thin films : Deposition and fabrication
(310.3840) Thin films : Materials and process characterization

ToC Category:
Applications

History
Original Manuscript: March 21, 2005
Manuscript Accepted: June 24, 2005

Citation
J. A. Dobrowolski, Yanen Guo, Tom Tiwald, Penghui Ma, and Daniel Poitras, "Toward perfect antireflection coatings. 3. Experimental results obtained with the use of Reststrahlen materials," Appl. Opt. 45, 1555-1562 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-7-1555

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