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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 7 — Mar. 1, 2006
  • pp: 1650–1656

Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection

Rasheed M. A. Azzam and Siva R. Perla  »View Author Affiliations


Applied Optics, Vol. 45, Issue 7, pp. 1650-1656 (2006)
http://dx.doi.org/10.1364/AO.45.001650


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Abstract

An all-transparent symmetric trilayer structure, which consists of a high-index center layer coated on both sides by a low-index film and embedded in a high-index prism, can function as an efficient polarizer or polarizing beam splitter under conditions of frustrated total internal reflection over a wide range of incidence angles. For a given set of refractive indices, all possible solutions for the thicknesses of the layers that suppress the reflection of either the p or s polarization at a specified angle, as well as the reflectance of the system for the orthogonal polarization, are determined. A 633   nm design that uses a MgF 2 ZnS MgF 2 trilayer embedded in a ZnS prism achieves an extinction ratio ( ER ) > 40   dB from 50° to 80° in reflection and an ER > 20   dB from 58° to 80° in transmission. IR polarizers that use CaF 2 Ge CaF 2 trilayers embedded in a ZnS prism are also considered.

© 2006 Optical Society of America

OCIS Codes
(230.5440) Optical devices : Polarization-selective devices
(240.0310) Optics at surfaces : Thin films
(260.5430) Physical optics : Polarization
(310.0310) Thin films : Thin films

ToC Category:
Optical Interference Coatings

History
Original Manuscript: March 7, 2005
Manuscript Accepted: August 13, 2005

Citation
Rasheed M. A. Azzam and Siva R. Perla, "Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection," Appl. Opt. 45, 1650-1656 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-7-1650

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