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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 45, Iss. 8 — Mar. 10, 2006
  • pp: 1688–1703

Polarimetric characterization of liquid-crystal-on-silicon panels

Justin E. Wolfe and Russell A. Chipman  »View Author Affiliations


Applied Optics, Vol. 45, Issue 8, pp. 1688-1703 (2006)
http://dx.doi.org/10.1364/AO.45.001688


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Abstract

Mueller matrix imaging polarimetry of liquid-crystal-on-silicon (LCoS) panels provides detailed information useful for the diagnosis of LCoS problems and to understand the interaction of LCoS panels with other projector components. Data reduction methods are presented for the analysis of LCoS Mueller matrix images yielding contrast ratio, efficiency, spatial uniformity, and the calculation of optimum trim retarders. The effects of nonideal retardance, retardance orientation, and depolarization on LCoS system performance are described. The white-state and dark-state Mueller matrix images of an example LCoS panel are analyzed in terms of LCoS performance metrics typical for red-green-blue wavelengths of 470, 550, and 640   nm . Variations of retardance, retardance orientation, and depolarization are shown to have different effects on contrast ratio, efficiency, and brightness. Thus Mueller matrix images can diagnose LCoS problems in a way different from radiometric testing. The calculation of optimum trim retarders in the presence of spatial variations is discussed. The relationship of the LCoS retardance in single-pass (from front to back) to the double-pass retardance (from entrance to exit) is established and used to clarify coordinate system issues related to Mueller matrices for reflection devices.

© 2006 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.3720) Optical devices : Liquid-crystal devices
(260.5430) Physical optics : Polarization

ToC Category:
Ellipsometry and Polarimetry

History
Original Manuscript: January 27, 2005
Manuscript Accepted: April 1, 2005

Citation
Justin E. Wolfe and Russell A. Chipman, "Polarimetric characterization of liquid-crystal-on-silicon panels," Appl. Opt. 45, 1688-1703 (2006)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-8-1688


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